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IEEE DTS Conference Chairs

Pr. Mohamed Masmoudi
National Engineering School of Sfax (ENIS) - Tunisia

Pr. Jaouhar Mouine
Prince Sattam bin Abdulaziz University (PSAU) - KSA

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DTS’19 Workshops

Workshop 1

Challenges and Emerging Solutions in Testing Embedded IO interfaces in 2.5D and 3D Systems

Workshop Summary:
In response to the increasing challenges in maintaining technology advancements through traditional scaling at a pace consistent with or exceeding Moore's Law, alternative methods to achieve enhanced system level performance are becoming increasingly important. Three-dimensional integrated circuit (3D IC) and 2.5D IC with Si interposer are regarded as promising candidates to overcome the limitations of Moore’s law because of their advantages of lower power consumption, smaller form factor, higher performance, and higher function density. Systems using embedded DRAM interconnected via a high density substrate with interposer-like technologies or via Thru-Silicon Via (TSV) are being introduced in a broad array of products.

In this workshop we present testability methodology practices for 2.5D and 3D products with embedded IO interfaces. As opposed to conventional testing, 2.5D and 3D ICs test flows are more complex and new DFx methodologies will be presented that provide good coverage and visibility to isolate failures in High Volume Manufacturing.

 

Presenter:
Full name: Salem Abdennadher
Affiliation: Intel Corporation
Email:
salem.abdennadher@intel.com

Presenter Biography:
Salem Abdennadher, Principal Engineer, Intel Corporation has 20+ years of experience in mixed-signal design and DFT. Soon after graduating with Masters from Oregon State University 1992, he joined the industry and has worked with a research lab in Tunisia, Motorola, Level One Communications and Intel. His recent publications and international patent filing in mixed signal DFT/BIST ranges from Filter BIST, On-chip Jitter BIST, to mixed signal behavioral modeling and noise extraction and prediction. Salem also has presented dozens of tutorials through TTEP at ATS, LATW, VTS, ITC. Presented multiple Workshops, publication, Special sessions presentation in International test Conference, VLSI test Symposium. European Test Symposium, Latin test Workshop

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Workshop 2

RiskStorming & Brand your Strategy

Workshop Summary:
In this workshop, Emna Ayadi wants to reignite your strategic fire by placing you in small groups with your colleagues. Together you will devise a strategy for a real-life product which includes methods, tools, and planning. However, just like in reality, the context will change, and our strategy must change accordingly to aptly react to that change. The workshop will use the TestSphere cards as a support to spark discussions and for bolstering your strategy. You will also cover how to:

  • Carry out the RiskStorming phase 1, 2, 3
  • Create a one-page test plan
  • Revise test plans
  • Pitch a strategy Outcomes

Participants of this workshop will learn how to:
* Work as a team to discuss and describe a strategy to tackle a real-life case and problem.
* Work out a proposal to convince their manager of tools, methods, and planning
*
Use the TestSphere cards as help and inspiration.

Workshop is limited to 18 participants
Workshop Duration : 2h30 min
Required material : 2 Big Tables each table contains 9 participants

Presenter:
Full name: Emna Ayadi
Affiliation: Primatec Engineering
Email:
Emna.ayedi@technica-engineering.de

Presenter Biography:
Emna Ayadi, Test Engineer within Primatec Engineering, graduated from the National School of Computer Science (ENSI), Tunisia in 2015. With more than 3 years of experience in software testing, She is passionate Quality Enthusiast and detail oriented who loves to analyse root cause, test, collaborate with diverse people and investigate issues. She had the chance to work in different fields of testing during her 3 years of experiences (mobile, web, desktop applications, automotive, ...). Participated in several national & international conferences such as “Belgrade Test Conference”, “Journée Tunisienne des Tests Logiciels (JTTL)”, IEEE TSYP. Also, Ministry of Testing meetup organizer in Sfax"