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IEEE DTS Conference Chairs

Pr. Mohamed Masmoudi
National Engineering School of Sfax (ENIS) - Tunisia

Pr. Jaouhar Mouine
Prince Sattam bin Abdulaziz University (PSAU) - KSA

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Submit your work and take part of the IEEE Student Research Contest at DTS2019

Deadline
February 28th, 2019


IEEE DTS’19 Call for Tutorials

IEEE DTS 2019 Conference will feature a state-of-the-art set of Tutorial presentations. The Organizing Committee invites proposals and ideas for tutorials to be held as part of the Conference. Tutorials will provide a good opportunity for conference attendees to learn from leaders in the field, explore cutting-edge topics, and acquire new insights, knowledge and skills. The topic should be of sufficient relevance with respect to the general scope of the conference.

Potential organizers are invited to submit a brief (one-page) proposal and addressed to the Tutorial Chairs

Tutorial Chairs:

Each Tutorial proposal should describe concisely the content, importance and timeliness of the tutorial. It should contain the following sections:

  • Tutorial’s title.
  • Tutorial’s type (introductory, intermediate, or advanced)
  • Summary describing the main focus and topics to be addressed and explained why the tutorial is appropriate for DTS.
  • A detailed outline of the presentation.
  • A description of the proposer’s lecturing expertise.
  • The proposed duration of the tutorial

Deadline:
Tutorials proposals due: February 4th, 2019

Tutorial 1: High-Speed I/O Testing in High-Volume Manufacturing

Presenter: Salem Abdennadher, Principal Engineer at Intel Corporation

Tutorial Summary: With advances in VLSI technology, packaging and architecture, Systems on Chip (SoC) continue to increase in complexity. Increasing complexity has resulted in an unprecedented increase in design errors, manufacturing flaws and customer returns related to High-Speed I/O (HSIO) circuits. This tutorial presents challenges and existing techniques to meet test complexity of HSIO and methodologies needed to achieve the high-quality usually mandated by the critical applications such as automotive and medical, etc. Both SerDes system and block level test techniques with particular emphasis on DFT/BIST based methods and their suitability to production level environment are presented in this tutorial. Additionally, this tutorial includes a section on Analog Defects and detection methods using DFT and BIST techniques.